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For Reference Only
| Part Number | SN74BCT8374ADWR |
| OEMstron Part # | SN74BCT8374ADWR |
| Manufacturer | Texas Instruments |
| Category | Semiconductors › Logic ICs › Specialty Logic |
| Description | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Lifecycle | Obsolete |
| RoHS | No RoHS Information |
| EDA/CAD Models | SN74BCT8374ADWR PCB Footprint and Symbol |
| Warehouses | USA, Europe, China, Hong Kong SAR |
| Estimated Delivery | Feb 24 - Mar 1 (Choose Expedited Shipping) |
| Warranty | Up to 1 year [Limited-Warranty]* |
| Payment |  |
| Shipping |  |
SN74BCT8374ADWR Specifications
| Part Number | SN74BCT8374ADWR | |
| Brand | Texas Instruments | |
| Lifecycle | Obsolete | |
| RoHS | No RoHS Information | |
| Product Line | Semiconductors | |
| Category | Logic ICs | |
| Subcategory | Specialty Logic | |
| Manufacturer | ||
| Series | 74BCT | |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |
| Supply Voltage | 4.5V ~ 5.5V | |
| Number of Bits | 8 | |
| Operating Temperature | 0°C ~ 70°C | |
| Mounting Type | Surface Mount | |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) | |
| Supplier Device Package | 24-SOIC |
SN74BCT8374ADWR Documents
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Global Supply Chains - Reliable and Authorized Distributor Resources
| Part Number | Description | Stock |
|
SN74BCT8374ADW D# V36:1790_07335374 Texas Instruments |
Scan Test Device RoHS: Compliant
|
Americas - 0 |
| Part Number | Description | Stock |
|
SN74BCT8374ADW Texas Instruments |
30 |
| Part Number | Description | Stock |
|
SN74BCT8374ADWR Texas Instruments |
N/A BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24 PLASTIC, SO-24 |
1000 |
|
SN74BCT8374ADWRG4 Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
Contact Us |
|
SN74BCT8374ADW Texas Instruments |
SCAN TEST DEVICE, D-FLIP FLOP SOIC24, Flip-Flop Type:D, Propagation Delay:6.7ns, Supply Voltage Min:4.5V, Supply Voltage Max:5.5V, Logic Case Style:SOIC, No. of Pins:24, Frequency:70MHz, Output Current:64mA, Packaging:Each , RoHS Compliant: Yes |
Contact Us |
|
SN74BCT8374ADWRE4 Rochester Electronics LLC |
74BCT8374 Flip Flop SN74BCT8374ADWRE4 |
0 |
| Part Number | Description | Stock |
|
SN74BCT8374ADWR D# SN74BCT8374ADWR-ND Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
Limited Supply - Call |
|
SN74BCT8374ADWRG4 D# SN74BCT8374ADWRG4-ND Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
Limited Supply - Call |
|
SN74BCT8374ADWRE4 D# SN74BCT8374ADWRE4-ND Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
Limited Supply - Call |
|
SN74BCT8374ADW D# 296-33849-5-ND Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
75 In Stock |
| Part Number | Description | Stock |
|
SN74BCT8374ADWR |
OEM/CM QUOTES ONLY | NO BROKERS |
2378 |
|
SN74BCT8374ADW |
OEM/CM QUOTES ONLY | NO BROKERS |
3154 |
| Part Number | Description | Stock |
|
SN74BCT8374ADWR Texas Instruments |
OEM/CM ONLY |
1060 |
|
SN74BCT8374ADW Texas Instruments |
OEM/CM ONLY |
862 |
|
SN74BCT8374ADWR00 Texas Instruments |
OEM/CM ONLY |
536 |
|
SN74BCT8374ADWRE4 Texas Instruments |
OEM/CM ONLY |
306 |
| Part Number | Description | Stock |
|
SN74BCT8374ADW D# 595-SN74BCT8374ADW Texas Instruments |
Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS: Compliant
|
104 |
| Part Number | Description | Stock |
|
SN74BCT8374ADW D# NS-SN74BCT8374ADW Texas Instruments |
OEM/CM ONLY |
5626 |
|
SN74BCT8374ADWRE4 D# NS-SN74BCT8374ADWRE4 Texas Instruments |
OEM/CM ONLY |
1821 |
|
SN74BCT8374ADWRG4 D# NS-SN74BCT8374ADWRG4 Texas Instruments |
OEM/CM ONLY |
5376 |
|
SN74BCT8374ADWR D# NS-SN74BCT8374ADWR Texas Instruments |
OEM/CM ONLY |
5215 |
| Part Number | Description | Stock |
|
SN74BCT8374ADWR Texas Instruments |
OEM/CM ONLY |
3020 |
|
SN74BCT8374ADW Texas Instruments |
OEM/CM ONLY |
3797 |
| Part Number | Description | Stock |
|
SN74BCT8374ADW Texas Instruments |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
996 |
| Part Number | Description | Stock |
|
SN74BCT8374ADW Texas Instruments |
shipping today |
3009 |
| Part Number | Description | Stock |
|
SN74BCT8374ADW Texas Instruments |
RFQ |
9504 |
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