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Part Number | SN74BCT8374ADWRE4 |
OEMstron Part # | SN74BCT8374ADWRE4 |
Manufacturer | Texas Instruments |
Category | Semiconductors › Logic ICs › Specialty Logic |
Description | IC SCAN TEST DEVICE W/FF 24-SOIC |
Lifecycle | Obsolete |
RoHS | No RoHS Information |
EDA/CAD Models | SN74BCT8374ADWRE4 PCB Footprint and Symbol |
Warehouses | USA, Europe, China, Hong Kong SAR |
Estimated Delivery | Nov 27 - Dec 2 (Choose Expedited Shipping) |
Warranty | Up to 1 year [Limited-Warranty]* |
Payment | |
Shipping |
SN74BCT8374ADWRE4 Specifications
Part Number | SN74BCT8374ADWRE4 | |
Brand | Texas Instruments | |
Lifecycle | Obsolete | |
RoHS | No RoHS Information | |
Product Line | Semiconductors | |
Category | Logic ICs | |
Subcategory | Specialty Logic | |
Manufacturer | ||
Series | 74BCT | |
Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |
Supply Voltage | 4.5V ~ 5.5V | |
Number of Bits | 8 | |
Operating Temperature | 0°C ~ 70°C | |
Mounting Type | Surface Mount | |
Package / Case | 24-SOIC (0.295", 7.50mm Width) | |
Supplier Device Package | 24-SOIC |
SN74BCT8374ADWRE4 Documents
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Global Supply Chains - Reliable and Authorized Distributor Resources
Part Number | Description | Stock |
SN74BCT8374ADWRE4 Rochester Electronics LLC |
74BCT8374 Flip Flop SN74BCT8374ADWRE4 |
0 |
Part Number | Description | Stock |
SN74BCT8374ADWRE4 D# SN74BCT8374ADWRE4-ND Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
Limited Supply - Call |
Part Number | Description | Stock |
SN74BCT8374ADWRE4 Texas Instruments |
OEM/CM ONLY |
306 |
Part Number | Description | Stock |
SN74BCT8374ADWRE4 D# NS-SN74BCT8374ADWRE4 Texas Instruments |
OEM/CM ONLY |
1821 |
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