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SN74BCT8374ADWRE4

SN74BCT8374ADWRE4
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For Reference Only

Part Number SN74BCT8374ADWRE4
OEMstron Part # SN74BCT8374ADWRE4
Manufacturer Texas Instruments
Category SemiconductorsLogic ICsSpecialty Logic
Description IC SCAN TEST DEVICE W/FF 24-SOIC
Lifecycle Obsolete
RoHS No RoHS Information
EDA/CAD Models SN74BCT8374ADWRE4 PCB Footprint and Symbol
Warehouses USA, Europe, China, Hong Kong SAR
Estimated Delivery Nov 27 - Dec 2 (Choose Expedited Shipping)
Warranty Up to 1 year [Limited-Warranty]*
Payment Wire Transfer, UnionPay, PayPal, Credit Card, Visa, MasterCard, AmericanExpress, Discover, WesternUnion, MoneyGram
Shipping DHL, UPS, FedEx, TNT, EMS, & More Express Delivery

SN74BCT8374ADWRE4 Specifications

Part Number SN74BCT8374ADWRE4
Brand Texas Instruments
Lifecycle Obsolete
RoHS No RoHS Information
Product Line Semiconductors
Category Logic ICs
Subcategory Specialty Logic
Manufacturer
Series 74BCT
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage 4.5V ~ 5.5V
Number of Bits 8
Operating Temperature 0°C ~ 70°C
Mounting Type Surface Mount
Package / Case 24-SOIC (0.295", 7.50mm Width)
Supplier Device Package 24-SOIC

SN74BCT8374ADWRE4 Documents

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Part Number Description Stock

SN74BCT8374ADWRE4

Rochester Electronics LLC

74BCT8374 Flip Flop SN74BCT8374ADWRE4

0
Part Number Description Stock

SN74BCT8374ADWRE4

D# SN74BCT8374ADWRE4-ND

Texas Instruments

IC SCAN TEST DEVICE W/FF 24-SOIC

Limited Supply - Call
Part Number Description Stock

SN74BCT8374ADWRE4

Texas Instruments

OEM/CM ONLY

306
Part Number Description Stock

SN74BCT8374ADWRE4

D# NS-SN74BCT8374ADWRE4

Texas Instruments

OEM/CM ONLY

1821

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