
Analog Devices, Inc. has introduced a millimeter wave (mmW) 5G front-end chipset that meets the required frequency band requirements, enabling designers to reduce complexity and bring smaller, versatile radio products to market faster. The chipset consists of four highly integrated ics, providing a complete solution that significantly reduces the number of devices required for 24GHz to 47GHz 5G radio applications.
As the global deployment of millimeter wave 5G accelerates, operators are under more pressure to both reduce rollout costs and expand network coverage with more energy-efficient, lighter and more reliable radio products. This requires highly linear, compact and energy-efficient broadband products that allow multiband designs to be reused without sacrificing quality and performance. ADI's millimeter-wave 5G front-end chipsets allow original equipment vendors (Oems) to move out of narrowband mode. In narrowband mode, competing solutions trade increased design execution difficulty and reduced radio frequency (RF) performance for bandwidth, while also outsourcing key intellectual property such as packaging, testing, and thermal modeling
The new chipset consists of two single-channel (1T1R) up/down frequency converters (UDC) and two dual-polarized 16-channel beamforming devices using an advanced CMOS process. The power efficiency and linear power output provided by the beamshaper result in reduced size, weight, power and cost of MMWAVE phased array designs compared to other solutions. The FULL FREQUENCY UP/DOWN CONVERTER HAS HIGH DRIVE LEVEL, DOES not NEED to provide a variety of models of different frequency bands, and combines the drive stage, saving material cost.
In addition to factory-configured non-volatile memory (NVM) via proprietary IP, the chipset provides seamless online operation of phased array calibration. This allows Oems to break the traditional design constraints of only NVM architectures, which are limited to one-time factory calibration of beamformers. This calibration does not solve the problem of non-ideal characteristics outside the IC and can lead to suboptimal calibration results.
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