Littelfuse introduces the gate driver evaluation platform

Littelfuse, a leading global manufacturer of circuit protection, power control and sensing technologies, announced the launch of the Gate Driver Evaluation Platform (GDEV). The new evaluation platform helps designers evaluate other peripheral components such as silicon carbide MOSFETs, silicon carbide Schottky diodes, and gate driver circuits so they can better understand how silicon carbide technology works in converter applications under continuous operating conditions.

Unlike most other silicon carbide evaluation platforms, GDEV offers quick-connect plug pin terminals to quickly and consistently compare different gate driver circuits. GDEV supports 800 V DC linked input voltages and switching frequencies up to 200 kHz.

Typical GDEV markets and applications include:

● Car EC/HEV charging station
● Industrial power supply
● Data center server
● Telecommunication base Station
● Solar/wind inverter

Corey Deyalsingh, Director of Power Control at Littelfuse, said: "The Gate Driver Evaluation Platform (GDEV) is an important expansion of the silicon carbide technology portfolio, as silicon carbide is still a relatively new technology and there are still some uncertainties about its operating characteristics under a variety of conditions. "GDEV helps engineers understand the operating characteristics of silicon carbide devices. By utilizing this evaluation platform, designers will be able to better understand the incredible energy saving opportunities presented by silicon carbide technology. With this knowledge in hand, we expect that designers will be more likely to incorporate SIC into their future designs."

Littelfuse's gate driver evaluation platform enables users to:

● Evaluate the continuous operation of silicon carbide power MOSFETs and diodes at rated voltage and rated current to provide active power to loads.

● Analysis of system impacts related to silicon carbon-based designs, including efficiency gains, EMI emissions, and passive components (size, weight, cost).

● Compare the performance of different gate driver solutions under well-defined and optimized test conditions.

● Test gate driver circuits under continuous operating conditions to evaluate gate driver thermal performance and EMI immunity.