
France's Microwave Vision Group, a system manufacturer leading the way in innovative antenna testing technologies, has announced the integration of RSE and passive antenna measurement capabilities in its popular MiniLAB system. The MiniLAB system can now not only perform high accuracy OTA tests, but also provide passive measurements and provide a new solution for measuring RSE on LTE devices.
For passive antenna measurements, MiniLAB's electronically scanned multi-probe array is packaged in a highly isolated darkroom to speed up measurements and map antenna radiation for devices up to 30 cm * in diameter, making it an ideal solution for optimizing antenna performance for a variety of devices.
Radiative spurious emission (RSE) refers to all non-fundamental emissions emitted by the device under test (DUT). High levels of radiation emission can pose functional challenges to certain wireless products, interfere with other wireless devices or radio systems, or alter the efficiency of the device itself.
For this reason, standardization bodies such as the International Telecommunication Union (ITU), the European Radio and Telecommunications Terminal Equipment (R&TTE) Directive, and the Federal Communications Commission (FCC) have established strict test requirements for measuring RSE on wireless devices. These test requirements are designed to eliminate the risk of interference when other wireless devices are near the device under test.
Historically, RSE has been measured using vertical scanning mechanical motion to monitor equipment as it rotates in azimuth. But this, like many traditional testing methods, is time-consuming during design and production, and time to market is critical for manufacturers.
In contrast, MiniLAB uses multi-probe technology to provide a new RSE test solution for measurement on LTE and other active devices. While providing accurate and stable data, the RSE testing needs of enterprises can be solved more quickly, in more detail, and more economically.
With MiniLAB, measurement times and accurate measurement data can be significantly reduced, and its integrated multi-probe array uses electronic scanning to measure wireless devices, making it easier and faster for users to measure RSE in the LTE band up to 6 GHz. After the measurement is completed, the RSE measurement results can be obtained within 20 seconds.
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