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TDK introduces flexible Multi-hall array sensing for high-precision electroflumetry

Jun 18 2021 2021-06 Sensors TDK
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TDK has expanded its Micronas Hall effect sensor product line with the CUR 4000 sensor. The sensor is designed to develop high-precision current measurement technology for automotive and industrial applications, providing non-invasive, electrically isolated, non-contact electrical fluometry.

     TDK has expanded its Micronas Hall effect sensor product line with the CUR 4000 sensor. The sensor is designed to develop high-precision current measurement technology for automotive and industrial applications, providing non-invasive, electrically isolated, non-contact electrical fluometry. These features will contribute to the future development of high-voltage systems for hybrid and electric vehicles (xEV). The product is suitable for DC and AC measurements, as well as overcurrent detection in high-power battery inspection applications, and can also be used to measure dynamic currents in the current range ≥2000A. For such measurement tasks, the CUR 4000 has different configurable modes for linear kernel application Settings and differential non-kernel application Settings.

 

     In the linear mode of the CUR 4000, the configurable Hall element array enables high-precision measurements for the design of a robust sensor module with a kernel stray field. Differential mode enables the design of minimum non-core and stray field robust systems without shielding. A full Hall array reading can achieve an output offset temperature drift of less than ± 0.05% of full scale. In addition, the sensor provides an output signal without hysteresis. A nonlinear error of ± 0.2% and a full-scale noise performance of ± 0.005% allow accurate current measurements at signal bandwidths up to 8kHz.

 

     TDK uses proven Hall sensor technology to construct the CUR4000. By programming non-volatile memory, major characteristics such as temperature-dependent gain and offset can be adjusted according to the magnetic circuit. According to ISO 26262, the CUR 4000 is defined to support SEooC ASIL-B with several on-board diagnostic functions that use redundancy technology or in combination with other current sensing technologies to lay the foundation for current sensor modules with higher ASIL levels.

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